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Microfabricated devices need to have competitive advantages such as ___, microelectronics integration, batch fabrication, and price
miniaturization
Linear elastic, brittle material
silicon
Electrical characteristics of silicon can be precisely controlled by addition of
dopants
P type dopant (group 3)
boron
N type dopants (group 5)
arsenic phosphorous
Transforms signals or power from one form of energy to another
transducer
Transform stimulus signals to a domain that is detectable
sensors
Transform energy from a non-mechanical domain to the mechanical domain
actuators
Cantilever's reaction to external stimulus
mechanical stress
Observations about how physics work at different sizes
scaling laws
As a shape grows in size, its volume grows faster than its surface area
square cube law
Stiction: liquid bridge formed between suspended member and substrate during liquid etching, when liquid is removed large ____ force is generated
capillary
Volume is related to
mass, weight, mechanical and thermal inertia
Surface is related to
pressure, buoyant forces
Remaining physical dimensions are assumed to scale linearly with the ___ dimension
characteristic
The ___ is a single crystal cut in slices from a larger piece called a wafer
substrate
Devices with multiple functional elements mounted on one chip
integrated circuit
Why silicon - mechanically stable, can be integrated with electronics on the same substrate, high ___, lightweight, high melting point at ___ C, virtually no mechanical hysteresis, extremely flat
young's modulus, 1400
Silicon structure: ___ with ___ additional body atoms
FCC 4
Single crystal silicon growth, technique for large crystals
CZ
Single crystal silicon growth, technique for smaller wafers with low oxygen impurity
float zone
Review CZ vs float zone
y
Principle uses of SiO2: thermal and electric ___, as a mask in ___, and as a ___ layer
insulator etching sacrificial
SiO2 is etched with
HF
Wet oxidation grows faster but leaves more ___ and has a lower
dangling bonds, density
SiC is stable, resistant to ___, can protect MEMS components from high temperatures
oxidation
Si3N4 is a good diffusion barrier and has high resistance to oxidation and many ___
etchants
Si3N4 dep technique
LPCVD PECVD
Poly si dep technique
LPCVD
Photoresists are typically ___ and require the same type for substrate surface
hydrophobic
High hydrophilic means small contact angle from ___ surface energy
high
SiO2 surfaces are covered by a layer of water physiosorbed form air that must be removed to avoid loss of ___
adhesion
Adhesion promotion steps: ___ at 100-200 C under vacuum, then exposed to adhesion promotion agent ___
dehydration, HDMS
___ priming typically has better results
vapor
Exposure to UV light makes the area more soluble in a developer and it is washed away
positive photoresist
Photoresist application by spin coating: good homogeneity, short process times, poor ___
material utilization
Softbake: removal of residual ___ and annealing of potential film ___
solvents stress
Smaller quartz plate with a few inset die used in stepper or scanner system over multiple exposures
reticle
Related to alignment for reticle
fudicials
___ exposure: glass mask in contact with substrate and the exposure is by shadow projection using parallel light
contact
___ exposure: small gap between glass mask and substrate, gap minimizes mask damage
proximity
___ exposure: image of glass mask is projected on a resist coated substate from a distance, no risk of mask damage
projection
___ exposure achieves the highest resolution if mask (reticle) images only a single device
projection
Most common light source for mems exposure
mercury vapor lamp
I line wavelength ___ nm
365
Post exposure bake used for the mechanical relaxation of thick photoresists like
SU8
Latent image formed by exposure is converted into final 3D relief image
development
Photoresist related issues: lack of adhesion and edge bead, uncoated areas, ___ defects
pinhole
Remove residual development solvents and anneal the film to promote adhesion
hardbake
___ lithography: electron beam can be used to write patterns of very high resolution in radiation-sensitive resist
ebeam
___ can be used in nanoscratch lithography to create grooves and trenches by using the cantilever to carve
AFM
___ uses a solid or liquid source material for creating thin films
PVD
The ___ of the system directly affects the quality of the film
vacuum degree
High vacuum allows vapor molecules to travel ___ distances before collision and reduces ___ of growing film
longer contamination
In vacuum chamber, evaporation material is only evaporated when its vapor pressure is above
1 pa
___ heating: High melting point conductor is fashioned into a basket or boat. Evaporation pellets are placed on conductors and high current is passed through them
direct
___ heating: heat resistant and stable materials are used to make a crucible, and heater heats and evaporates the material through the crucible
indirect
Thermal evaporation is a ___ process
PVD
Thermal evaporation is a ___ deposition process under ___ vacuum conditions
line of sight, high
Induction heated source uses RF to create ___ currents that heat directly at the evaporant, making the process more efficient than resistance heating. Needs ___ cooling
eddy water
Electron beam heating allows high ___ density, low contamination, and high control of evaporation rate
power
In e beam heating only the ___ melts due to water cooled crucible
surface
E beam heating allows much higher temperatures for materials such as
Pt, SiO2
Plasma based deposition technique in which energetic ions are accelerated towards a target, ions strike target and atoms are ejected from the surface and incorporate into growing film surface
sputtering
For sputtering there is ___ vacuum level, high voltage is applied to initiate plasma generation, electrons in sputtering gas are accelerated away from the ___, causing ionization
high cathode
Sputtering gas chosen to have high ___
molecular weight
Reactive gas sputtering: higher ___ rates and more precisely controlled stoichiometry
deposition
In ___ sputtering magnetic fields are used to control ion velocity and behavior
magnetron
Magnetron sputtering traps electrons by ___, allowing faster deposition
target
Removing atoms by sputtering with inert gas, low surface damage etching technique
ion milling
DC sputtering is limited for ___ materials
dielectric
RF sputtering alternates electric potential of the current to avoid ___ buildup, increases ___
charge growth
Very dense thin film coatings from high current voltage spike that increases ionization
high power impulse magnetron sputtering
Nearly all materials can be deposited by ___ sputtering
magnetron
In sputtering alloys and compounds can be deposited with maintained
composition
Used to measure film thickness during sputtering
quartz crystal oscillator
Evaporation of alloys from a single source is possible if there is no ___ of the components into fragments
dissociation
Co sputtering most often used with reactive ___ sputtering
magnetron
Co sputtering uses multiple cathodes with ___ power controls
independent
Co sputtering can result in ___ damage to the substrate
heat
Better step coverage?
Sputtering
Which is slower? Sputtering or evaporation
sputtering
Easier control of film properties with
sputtering
Growth mechanism for single crystal films that receive their crystalline orientation from a substrate (also with a single crystalline structure)
epitaxial
If single crystal film and substrate are the same material
homoepitaxial
Single crystal film and substrate are different materials, typically showing a lattice mismatch
heteroepitaxial
Molecular beam epitaxy: ___ cells surrounded by liquid nitrogen
effusion
Effusion cell: Elongated crucible with radiation shields, stable up to temp of ___ C
1400
MBE: ___ vacuum conditions-> very long mean free path -> no ___
ultrahigh, collisions
Particularly suited for deposition of ceramic materials
PLD (pulsed laser deposition)
High power laser pulse ablates material from a target due to ___ interaction
photonic
In PLD highly directional ___ plume recondenses to form a film
plasma
Single target is typically sufficient for complex composition, multi target for layered structures
PLD
Most widely used deposition method
CVD
In CVD films deposited are result of chemical reaction between the reactive gas(es) and ___, and/or between the reactive gases and the ___ of the substrate surface
reactants atoms
CVD ___ reactions occur before the gas molecules reach the wafer surface, slower reaction rate, low ___ and lower ___ film
homogeneous density quality
CVD ___ reactions occur on or near the substrate surface, better ___
heterogeneous quality
Both gas phase and surface phase deposition are greatly affected by
temperature
Uses vacuum pump to reduce pressure in reaction chamber to less than 1 atm
LPCVD
Low pressure, but also uses plasma to provide higher deposition rates at lower temperatures than LPCVD
PECVD