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TEM-based diffraction is known as
Selected-Area diffraction (SAD)
SAD
pattern from limited area
allows for determination of crystal diffraction from different sample regions
If wavelength is small, Ewald sphere is
Large
TEM vs XRD - scattering method
XRD - scatter by shell electrons
SAD/TEM - scattering by atom nucleus
TEM vs XRD - diffraction angle
XRD - 0-180 degree angle
SAD - small angle
XRD vs TEM - intensity/precision
XRD - low intensity, high precision
SAD/TEM - high intensity, low precision
Kikuchi lines
Bright and dark lines in scattering patterns due to inelastic scattering in thicker samples
EBSD
Orientation mapping to see Kikuchi Patterns