Electron Microscopy and Probe Microscopy

Flashcards covering key concepts, terms, and definitions related to electron and probe microscopy.

Electron Microscope

A type of microscope that uses electromagnets instead of lenses to magnify samples.

Vacuum

A space devoid of matter, where living samples cannot survive, used in electron microscopy.

Scanning Electron Microscopy (SEM)

A type of electron microscopy that produces a three-dimensional image of the sample surface.

Transmission Electron Microscopy (TEM)

A type of electron microscopy that provides images of the internal structure of a sample.

Probe Microscopy

A microscopy technique that uses a probe to scan the surface of a sample without physical contact.

Scanning Tunneling Microscope (STM)

A type of probe microscopy that can image surfaces at the atomic level and does not require contact with the sample.

Atomic Force Microscopy (AFM)

A type of probe microscopy that involves a probe that touches the sample and utilizes a cantilevered arm.

Cantilevered Arm

A structure in atomic force microscopy that allows a probe to move up and down over the sample surface.

Tungsten Probe

A highly precise probe typically used in probe microscopy, with a tip that is one atom in diameter.

Nanosellulose

A lab-created substance observed at the atomic level using probe microscopy.