Measurement of Physical Properties of Solids

These flashcards cover key vocabulary and concepts discussed in the lecture on measuring physical properties of solids.

Morphology

The study of the structure and shape of materials at various scales, influencing material properties.

Scanning Electron Microscopy (SEM)

A powerful imaging tool that provides high resolution images by scanning a specimen with a focused beam of electrons.

Secondary Electrons

Electrons emitted from a specimen surface due to the interaction of the electron beam with the atoms of the sample.

Raster Scanning

A scanning process where the electron beam scans the sample in a rectangular pattern over its surface.

Transmission Electron Microscopy (TEM)

A microscopy technique that transmits electrons through a specimen to form an image.

Atomic Force Microscopy (AFM)

A type of scanning probe microscopy that measures the forces between a probe tip and a sample surface.

Scanning Tunneling Microscope (STM)

A technique that produces high-resolution images by scanning a surface with a focused electron beam.

Differential Scanning Calorimetry (DSC)

A thermal analysis technique measuring heat flow differences between a specimen and a reference sample during temperature changes.

Four Point Probe

A technique to measure electrical conductivity where four probes are used to minimize contact resistance effects.

Vibrating Sample Magnetometer (VSM)

A device that measures magnetic properties of materials by vibrating them in a magnetic field.