Exam 2 - Materials Characterization - Part 2 (spectroscopy)

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77 Terms

1
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Important parts of a UV-VIS spectrometer

Source, entrance slit, monochromator, exit slit, sample, dispersion device, detector

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What do optical spectrophotometers measure?

Optical Density (OD)

Absorbance (A)

Transmittance (T) 

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What law is UV-VIS based on?

Beer Lambert’s Law

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How does UV-Vis work?

Passes UV/VIS light through sample and see how much is absorbed - molecules absorb certain wavelengths of light

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Applications for UV-Vis spectroscopy

Measure various concentrations of a material and their absorption

Quantified metal speciation (ppb)

Looking at conjugated systems

Comparing sugars/salts/organics with nucleic acids, proteins (size difference)

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First derivative UV-Vis

Shows slope, emphasizes changes 

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Second derivative UV-Vis

Emohasizes changes more strongly, shows curvature

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Which derivative for Uv-Vis gives the best data in terms of peak sharpness

2nd derivative

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What region in wavelength is vibrational spectroscopy?

10-4 nm to 10-6 nm

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What region in wavenumber is vibrational spectroscopy?

10²-104 cm-1

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For stretching vibrations, what is the maximum number of bonds?

1

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For bending vibrations (in-plane), what is the maximum number of bonds?

2

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For bending vibrations (out of plane), what is the maximum number of bonds?

3

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For torsion vibrations, what is the maximum number of bonds?

3

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What model determines molecular vibrations by quantum mechanics?

Harmonic Oscillator

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Rate the size of energy gaps of each degree of freedom from smallest to largest

Translation, Rotation, Vibration, Electronic 

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General FTIR schematic

Incident beam split into 2 by beam splitter, interferogram can be interpreted based on its Fourier Component

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What kind of molecules are good to look at with FTIR?

Molecules with changing dipole moments

Look at bond changes (such as polymers, liquids, NOT SALTS)

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Stokes Scattering 

Go from v=0 to virtual state back down to state right above v=0

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Rayleigh Scattering

Go from v=0 to virtual state back down to v=0

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Ant-stokes scattering

Go from state right above v=0 to virtual state and then down to v=0

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What does Raman measure?

Stokes, Anti-Stokes, Rayleigh from E0 to E1

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Raman and IR do/do not see the same features

Can see the same but can also not

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Raman - polarizability

Molecule must undergo change in polarizability during vibration, meaning that is it easy or difficult to distort electrons from their original positions?

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Polarizability of a molecule decreases with:

  • increasing e- density

  • increasing bond strength

  • decreasing bond length

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Symmetrical stretching, Raman/IR active? CO2

Raman - Yes

IR - no

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Asymmetrical stretching, Raman/IR active? CO2

Raman - no

IR - Yes

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Bending, Raman/IR active? CO2

Raman - no

IR - yes

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Raman Microscopy Applications in Materials Science

  • Composition analysis

  • Strain/stretch of materials will shift their peaks and intensities

  • Examine materials with microscopy - geological samples

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Pros of Using Raman (over FTIR)

  • Low frequency modes

  • Easy sampling

  • Resonance and surface enhancements possible

  • Water compatible

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FTIR Advantages

  • Good fingerprint libraries abailable

  • Fundamental vibrations

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FTIR and Raman both have _______ linewidths

narrow

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Electron spectroscopy general technique

Analytical technique that detects emitted electrons from atoms and solids, can provide chemical and electronic information from surface

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Electron spectroscopy is complementary to these two materials characterization methods 

XRD 

Vibrational Spectroscopy

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X-Ray Photoelectron Spectroscopy (XPS) does what?

Measures binding energies of core electrons ejected by X-rays

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What can XPS measure

Element ID (Z>3), near-surface composition

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Peaks on an XPS occur when

Excitation occurs (energy excited core level)A

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Auger lines

Outer shell electron fills inner hole vacancy, energy from that can result in emission of Auger electron

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XPS is surface-specific because

inelastic mean free path can differ based on the material, so the sampling depth can change between 1-10 nm

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How can XPS perform elemental composition

Wide scan at modest energy and label all peaks 

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Chemical shifts XPS

Oxidation/bonding modifies local potential

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Peak width XPS

Reflects state distribution, inhomogeneity, relaxation effects

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Splutter XPS 

Analyze chemical composition of material at different depths 

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Auger Process

  1. create core hole by electron beam or x ray

  2. upper electron drops to fill hole and transfer energy to another electron

  3. second electron emitted as auger electron

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KLL

LMM

MNN

KLL - initial

LMM - final hole

MNN - final hole 

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Auger Electron Spectroscopy

Surface analytical technique detecting element specific Auger electrons after core-level ionization and non-radiative relaxation

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AES used for

  • extreme surface sensitivity

  • elemental mapping (Z >= 3)

  • depth profiling with sputtering

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AES does not measure _______ composition well

bulk

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KLL 

Electron in K shell removed (hole)

Electron in L shell drops to K to fill hole

Energy released from dropping used to eject electron from L shell

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LMM

Hole in L shell

M to L drop

Energy to M electron

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Direct mode AES

Auger peaks on large secondary-electron background

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Derivative mode AES

Peaks become zero crossings, improve visibility/Auger structure

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Each element has distinct these three lines AES

KLL

LMM

MNN

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Auger yield is _______ at low Z 

high

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X-ray yield is ________- at high Z

high

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AES excellent for _______ elements, Xray good for __________ elements

light;heavy

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Depth profiling AES

Sputter thin layer with inert ions, measure Auger windows sequentially 

<p>Sputter thin layer with inert ions, measure Auger windows sequentially&nbsp;</p>
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“Fake” Auger peaks

  • Plasmon loss peaks

  • Ionization loss peaks

  • Secondary electrons

  • Checks

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Scanning Auger Microscopy (SAM)

Scan a focused e- beam, at each pixel measure elements Auger intensity (higher intensity = brighter pixel)

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Limitations of AES

  • charging (contamination)

  • beam damage

  • topography

  • sputtering/mixing

  • interferences 

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Size of AES samples

Wafers, cut carefully to avoid contamination

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PES

Photoemission from solids/molecules

Measures binding energy distribution of occupied states

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Photoemission model

  1. optical excitation of electron

  2. transport electron to surface

  3. electron can escape across surface barrier into vacuum —> analyzer

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UPS 

UV-Photoelectron Spectroscopy

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Why is UPS surface-sensitive?

Valence electrons sample first top players, sensitive to overlayers

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UPS Method

  • Apply small negative sample bias to separate cutoff

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Electron Energy Loss Spectroscopy 

Measures energy lost by fast electrons transmitted through thin specimens 

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What kind of samples does Electron Energy Loss Spectroscopy work for?

Light elements, bonding

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Singal from EELS

Incident electrons undergo inelastic scattering, lose energy, can track and sort electrons by energy on detector

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Low-Loss EELS 

1-50 eV 

Plasmons, interband, bandgap

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Core loss EELS

>50 eV, element-specific (KLM)

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X-ray Photons

Can penetrate deeper and closer to the nuclei

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EDS detector 

Specific number of electron-hole pairs generated, dependent on X-ray energy

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EDS or WDS have higher StN ratio

WDS

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EDS lightest element detected

Oxygen (Z=8)

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XRF analysis goal

Understand elemental composition, can find weight fraction and compare against intensity 

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X-ray absorption spectroscopy source

  • table top X ray emitter

  • Synchrotron