IB Physics HL - Topic 9

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25 Terms

1
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displacement starting at equilibrium

x = x0sin(ωt) where ω is the angular frequency (2pi*f)

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displacement starting at maximum

x = x0cos(ωt) where ω is the angular frequency (2pi*f)

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Energy changes in SHM

total energy is constant, KE is max at 0 displacement, PE is max at max and min displacement

<p>total energy is constant, KE is max at 0 displacement, PE is max at max and min displacement</p>
4
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the angle of diffraction for first minimum in single slit diffraction

wavelength/widthof slit

<p>wavelength/widthof slit</p>
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Single Slit Diffraction condition for a minimum

width*sin(θ) = mλ

<p>width*sin(θ) = mλ</p>
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Width of bright spot in Single-Slit Diffraction (y)

y = mλD/a

<p>y = mλD/a</p>
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Young's double slit experiment

light is projected onto a screen with 2 small slits. The light waves diffracting through the 2 slits interfere with one another and produce a predictable pattern of alternating light and dark bands (maxima and minima) on the detector screen

<p>light is projected onto a screen with 2 small slits. The light waves diffracting through the 2 slits interfere with one another and produce a predictable pattern of alternating light and dark bands (maxima and minima) on the detector screen</p>
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double slit diffraction maxima equation

distance between slits*sinθ = mλ

<p>distance between slits*sinθ = mλ</p>
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double-slit minima equation

distance between slits*sinθ = (m+1/2)λ

<p>distance between slits*sinθ = (m+1/2)λ</p>
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thin film interference

a phenomenon in which a spectrum of colors is produced due to the constructive and destructive interference of light waves reflected in a thin film

<p>a phenomenon in which a spectrum of colors is produced due to the constructive and destructive interference of light waves reflected in a thin film</p>
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Thin-film interference phase shift

reflected waves have a 180 degree (1/2λ) phase shift when n2 > n1. reflected waves have no phase shift when n1 > n2

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Multiple slit diffraction maxima equation

distance between slits*sinθ = mλ

<p>distance between slits*sinθ = mλ</p>
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thin film interference destructive interference equation

2dn = mλ

<p>2dn = mλ</p>
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thin film interference constructive interference equation

2dn = (1/2 + m)λ where d = thickness of film, n = index of refraction in film, m = order, λ = wavelength of light

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wave-particle duality

the concept that all matter and energy exhibit both wave-like and particle-like properties

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Resolution

the ability to distinguish two separate points

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Larger aperture

more resolved

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Raleigh criterion

when two points are just resolved, θ = 1.22λ/diameter of aperture

<p>when two points are just resolved, θ = 1.22λ/diameter of aperture</p>
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Source moving toward observer

subtraction in denominator

<p>subtraction in denominator</p>
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Source moving away from observer

addition in denominator

<p>addition in denominator</p>
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observer moving toward stationary source

addition in numerator

<p>addition in numerator</p>
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observer moving away from stationary source

subtraction in numerator

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values in moving observer situation

velocity of wave changes, wavelength is constant, frequency changes

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values in moving source situation

velocity of wave is constant, wavelength changes, frequency changes

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doppler equation for electromagnetic waves

change in f / original f = v/c, should only be used when v is much smaller than the speed of light

<p>change in f / original f = v/c, should only be used when v is much smaller than the speed of light</p>