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BUSSCM 1780 Kimpel 2025
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Standard Normal Distribution
μ = 0, std dev 𝝈 = 1, symmetrical, area = 1
probability
Normal-shaped variation allows us to predict the ___________ (likelihood) of future events
Vertical axis
measures the probability density and peaks at μ = 0
Horizontal axis
is scaled in standard deviations (𝝈)
Convex, concave
𝝈 = 1 is the distance from μ where the curve changes from _______ to ________
dot plot, histogram
If you have hundreds of data points….you can create a _______, __________ and visually inspect for symmetry and bell shape
normal probability plot
If you do NOT have hundreds of data points….you can create a __________________.
Traditional Yield (Y)
The proportion of good vs. acceptable items (conforming to specification) you get out of a process compared to the number of raw items
Typically employed on the LAST final inspection step of a process
This is a misleading measure because it hides the impact of inspection and rework!
First Time Yield (FTY)
First time yield accounts for rework in a process
Inspection is the doorway to the hidden factory
This measure shows the LIKELIHOOD of an item passing through one process step successfully the first time!
Rolled Throughput Yield (RTY)
Most processes have more than one step
How do you calculate the overall yield for a string of process steps?
Multiple the first time yields for each step together
This measure is the COMBINED overall yield of and end-to-end process and tells you the likelihood of an item passing through all process steps successfully the first time
Defects
DPU = number of defects observed / number of units inspected
DPO = number of defects / (number of opportunities for error per unit)*(number of units)
DPMO = DPO * 1,000,000
Defects per Unit (DPU)
A basic assessment of a characteristic or process capability is to measure the total number of defects that occur over a given number of units
DPU provides a measure of the AVERAGE number of defects on a single unit
Defects per Opportunity (DPO)
A DPU of 0.478 for an automobile is viewed differently than the same rate on a bicycle because of different levels of complexity
To “level the playing field” create a defects per opportunity rate
DPO allows you to fairly compare the defect rates of things with very different levels of complexity
Defects per Million Opportunities (DPMO)
When the number of opportunities on a unit grows LARGE and the number of observed defects grows SMALL, DPO becomes very SMALL
Additionally, you may want to estimate the number defects after running the process or observing the characteristic after a long time
A simple way to solve both problem is to measure the defects over a large number of opportunities
Sigma (Z) score
Z = |SL - x-bar| / 𝝈
A Six Sigma level of quality is defined as 3.4 DPMO
A sigma score tell you HOW MANY standard deviations can fit between the mena and specification limit of any process or specification
Statisticians call this Sigma (Z) score or NORMAL SCORE
Low
A ______ sigma (Z) score means a significant portion of the tail extends beyond the SL
High
A _________sigma (Z) score when the variation distribution is far from SL
Changes to Sigma (Z) Scores
A sigma (Z) score can change in one of three ways:
The central tendency can shift
The width of the distribution, as defined by 𝝈, can change
The location of the specification limit (SL) can change
Short-term Sigma (Z) score
the best performance you can expect from your currently configured process
Short-term entitlement variation is an idealistic measure of capability
Long-term Sigma (Z) score
Six Sigma practitioners measure short-term variability of a process or characteristics and calculate the sigma (Z) score
Then they translate the short-term sigma (Z) score to long-term defect rate performance using a 1.5 short-term standard deviation shift
Capability ratios & indices
a set of measures that directly compare the voice of the customer (VOC) with the voice of the process (VOP)
Six Sigma practitioners have defined the “effective limits” of any process as being THREE standard deviations (𝝈) from the mean which implies 99.7%
Short-Term Capability (Cp)
Compares the width of a two-sided specification to the effective process limits
Notes:
A capable process must have a Cp of at least 1.0
Six Sigma quality requires a Cp = 2.0
Does not look at how well the process is centered in the specification range
Short-Term Capability Index (Cpk)
Accounts for off-center processes
Notes:
When the upper and lower indices are the same then the process is centered
A capable process must have a Cpk of at least 1.0
Six Sigma quality requires a Cpk = 2.0