Diploma Chapter 8 Advanced Laboratory Testing Equipment in Gemmology

Flashcards covering advanced laboratory testing equipment in gemmology, including techniques, instruments, and applications.

Refractometer

A standard gem-testing tool used to measure the refractive index of gemstones.

Spectroscope

A standard tool in gemmology for observing the spectrum of light emitted or absorbed by gemstones.

X-ray Radiography (XRG)

An imaging technique that uses X-rays to show the internal structure of a specimen, effective for pearl identification.

X-ray Diffraction (XRD)

A technique that reveals the crystal structure of minerals by analyzing the diffraction patterns produced when X-rays interact with crystalline material.

X-ray Fluorescence (XRF)

A method used to identify chemical elements in a sample based on the characteristic X-rays they emit when irradiated.

Energy-Dispersive X-ray Fluorescence (EDXRF)

An analysis technique that measures the entire spectrum of emitted X-rays simultaneously to determine chemical composition.

Scanning Electron Microscope (SEM)

An electron microscope that provides high-resolution images of a sample's surface and detects scattered electrons.

Fourier Transform Infrared Spectroscopy (FTIR)

A technique that measures how much infrared radiation a material absorbs at different wavelengths, producing a 'fingerprint' spectrum.

Laser Raman Spectroscopy (LRS)

A technique that uses laser light to examine molecular vibrations, enabling identification of various materials without sample preparation.

Ultraviolet-visible-near infrared spectroscopy (UV-Vis-NIR)

An instrument that measures the absorption of UV, visible, and near-infrared light, critical for determining the color and treatment of gemstones.

Inductively Coupled Plasma Mass Spectrometry (ICP-MS)

A high-precision elemental analysis method that detects trace elements by converting sample atoms into ions in a plasma.

Laser-Induced Breakdown Spectroscopy (LIBS)

A method that analyzes the elemental composition of materials by creating a plasma with a laser and measuring the emitted light.

Secondary Ion Mass Spectrometry (SIMS)

An ultra-sensitive method for elemental analysis that ejects atoms from a material's surface using a primary ion beam.

Micro-destructive analysis

Technique involving the removal of a tiny amount of material to assess its composition, commonly used with ICP-MS, LIBS, and SIMS.