Maintenance and Repair of Electronic Circuits

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These flashcards cover methods, formulas, and concepts related to the maintenance, reliability, and troubleshooting of electronic circuits as described in the lecture transcript.

Last updated 9:05 AM on 6/8/26
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28 Terms

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General Troubleshooting Process

A process involving physical observation, identifying failure symptoms, component testing, and checking input-output for each block.

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Component Specifications

Data used to recognize usage, absolute maximum limits, and other important electrical data to assist in troubleshooting.

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Infant Mortality

A stage of failure occurring shortly after equipment is manufactured and shipped to the customer.

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Normal Failure Stage

The period where failures occur due to the working age of the equipment, typically having the lowest failure rate percentage.

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Final Failure Stage

The period where an equipment experiences its highest failure rate because its working life has ended.

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Partial Failure

A change in characteristics or parameters outside of specifications that does not fully eliminate the tool's overall function.

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Mean Time To Fail (MTTF)

The duration of component usage until failure occurs, specifically for non-reparable electronic components.

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MTTF Formula

MTTF=1FRMTTF = \frac{1}{FR}

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Mean Time Between Failures (MTBF)

The duration of system usage until failure occurs, used for reparable circuits, instruments, and systems.

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Circuit Failure Rate Formula

FR(circuit)=FR(A)+FR(B)+FR(C)+...FR(\text{circuit}) = FR(A) + FR(B) + FR(C) + \text{...}

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MTBF Formula

MTBF(\text{circuit}) = \frac{1}{\text{\alpha}}, where \text{\alpha} is the total circuit failure rate.

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Exponential Law of Reliability

States that the probability of no system failure within time tt is an exponential function of that time.

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Reliability (R) Formula

R=eαtR = e^{-\alpha t} or R=et/mR = e^{-t/m}

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Failure Probability (Q) Formula

Q=1R=1eαtQ = 1 - R = 1 - e^{-\alpha t}

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Derating

A technique to improve reliability by operating a component below its maximum limits, such as using a 12W\frac{1}{2}\,W resistor where only 14W\frac{1}{4}\,W is required.

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Redundancy

Connecting units with the same function in parallel so if one fails, the other takes over.

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Active Redundancy

A standby unit that is powered on and ready to follow/replace a failure immediately, such as a UPS for a computer.

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Passive Redundancy

Elements that share a load or perform functions separately but are not automatically activated, such as a manual office generator.

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Symptom-function Method

A troubleshooting technique used to isolate damage to specific parts by checking basic symptoms like power cables, fuses, or switches.

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Signal-tracing Method

A method used to find a specific block causing failure by tracking signals through the system.

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Voltage and Resistance Method

Comparing measured data against manufacturer specifications; voltage is measured while the device is ON, and resistance is measured while it is OFF.

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Half-splitting Method

A technique used for serial block circuits where the system is divided in half repeatedly until the fault is found.

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Loop Breaking Method

Used for electronic systems with feedback, such as a Phase Lock Loop (PLL), by disconnecting the loop and injecting DC voltage or signals.

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Substitution Method

The final stage of troubleshooting involving replacing a suspected component with a known good one using correct connections.

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Failure Analysis

Used for recurring failures by analyzing circuit operation, performing measurements, and studying product data.

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Signal Analysis

Using tools like a memory oscilloscope to visualize signals as clues to locate damage.

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Logic Analysis

Limited to digital circuits, using one and zero signals to determine which logic function is malfunctioning through bit-per-bit testing.

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Routine Diagnosis

A self-test program used in systems with at least one programmable microprocessor to perform quick internal checks.