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in general, all experimental error derives from one of 3 sources:
human, systematic, random
the most difficult type of error to guard against
human
(type of error) transposing two digits of a reading, misinterpreting data
human
(type of error) voltmeter reading below correct value, thermocouple that reads temperature too high
systematic
cure for systematic error
calibration
comparing the reading of a given instrument to a known standard (preferably traceable to the National Institute of Standards and Technology - formerly National Bureau of Standards)
calibration
cure for random error
average a sufficiently large number of measurements
when plotted as frequency of observation (f) vs. measured value (x), random experimental errors follow
a bell-shaped curve
bell-shaped curve random error follows
Gaussian or normal distribution
Gaussian distributions are characterized by their
mean and standard deviation
(sample) standard deviation equation
sigma(^^x)=

population standard deviation
replace n-1 to n in denominator
small sigma in bell curve
thinner peak
if data is Gaussian/normal distribution, ______% of measured x values will fall within interval (mean + stdv, mean - stdv)
68%
if data is Gaussian/normal distribution, ______% of measured x values will fall within interval (mean + 2*stdv, mean - 2*stdv)
95
if data is Gaussian/normal distribution, ______% of measured x values will fall within interval (mean + 3*stdv, mean - 3*stdv)
99
percentage confidence level (defined by stdv) of if a particular x value falls within a particular interval
confidence intervals
confidence interval widely used for engineering measurements
95% (mean + 2*stdv, mean - 2*stdv)
propagation of experimental error: mean (true value)
mean value = f(mean of each individual variable)
propagation of experimental error: st. dev (uncertainty)
uncertainty value = sqrt(sum of (derivative of f in respect to each individual variable)squared))
fractional uncertainty
uncertainty / value
resistance to penetration of an indenter under a prescribed load
hardness
prescribed combination of load and indenter
Rockwell hardness tests
linear regression aka
linear least-squares fit
linear least squares equations
(sumxi^2)a+(sumxi)b=(sumxiyi)
(sumxi)a+nb=(sumyi)
in general, an n-th order polynomial fit will yield ______ linear equations for the constant in the polynomial
n+1
how to fit a power-law relation of the form y=cx^a
take logs of both sides so that
lny=alnx+lnc
where b=lnc
(so lny=alnx+b)
fit curve fit of form y=ce^ax
take logs of both sides so that
lny=ax+lnc
where b=lnc
(so lny=ax+b)
types of graph paper
linear
semi-log (lny vs x)
log-log
data falls close to a straight line on linear paper
y=ax+b (linear fit)
data falls close to a straight line on semi-log paper
y=ce^ax (exponential fit)
data falls close to straight line on log-log paper
y=cx^a (power-law fit)
**may be typo in notes?
indicates how good a curve fit is
correlation coefficient (r)
solve for correlation coefficient
ym=(1/n)(sumyi) -> mean of values
oy=sqrt([sum(yi-ym)^2]/n-1) -> stdv
ybari=axi+b
oxy=sqrt([sum(yi-ybari)^2]/n-2)
r=sqrt(1-[oxy^2/oy^2])
values for a perfect fit
oxy=0
r=1
the closer "r" is to 1...
the better the fit
length of time a system takes to make one complete oscillation
period of oscillation
before being converted to a digital signal, the measured quantity must be converted to an ______ signal (usually a voltage)
analog
a signal that can take on any value and can vary continuously with time
analog
representations of analog signals that can take on only certain discrete values and are not continuous functions of time
digital
usually we measure experimental quantities using ___
transducers
a device that converts the quantity of interest into an electrical voltage
transducer
usually the output of a transducer will be ____ in the quantity of interest (at least over a certain range)
linear
v=kx, what is k?
sensitivity of the transducer (constant of proportionality)
v(t) represents the _______ we wish to convert to digital form
analog signal (v is the output of transducer)
take the value of the analog signal at certain times and convert this value to digital form
sample
in order to convert the analog signal to digital form, we _____ the analog signal at fixed intervals of time
sample
take continuous analog signal and replace it with ______ digital representation
discrete (value of the signal known only at the same instants of time we sampled the analog signal)
if signal is sampled often enough, easy to estimate the value of the signal at a time other than sampling times using....
simple interpolation
rate at which we sample the signal (usually samples/sec, or hertz)
sampling rate
the higher the sampling rate
the more accurate our representation of the analog signal
device used to convert analog signal to digital form
analog-to-digital converter (A/D converter)
how does an A/D converter work
integrated circuit (IC) board takes 1+ analog voltages and outputs their digital representations into one of the ports of a personal computer (PC)
determines what the analog signal can be representated as digitally by an A/D converter
bits
(1 bit = can only represent as 0 or 1
2 bits = can represent as 4 options, (0,0), (0,1) etc
n bits = can represent as n^2 options)
value that A/D converter distinguishes between
resolution
(1 bit = divide range of signal voltages by 2
2 bit = divide by 4...
n bit = divide by n^2)
bit value of A/D converter we used
16
slope of linear portion of output voltage of A/D converter vs displacement curve
sensitivity of LVDT (LABVIEW data acquisition system)
how does LVDT (measures linear displacement) operate
senses difference in voltage induced in 2 adjacent coils by a moving inner rod
LVDT output cannot be used in raw form; must be passed through a _______ to be converted to usable form
signal conditioner
output of signal conditioner is fed directly to
A/D converter
how to calibrate LVDT transducer
take the slope of linear portion of voltage vs displacement curve (displacement=(change in voltage)/k)
slope k depends on the _______ to the LVDT
voltage supplied by the power supply (if input voltage is changed, k will change and LVDT must be recalibrated)
LVDT initially clamped in a fixture in series with...
micrometer head (LVDT core may be precisely adjusted by moving micrometer head)
micrometer used for LVDT has a range of ___ and may be adjusted to within ____
25 mm, +/- 0.01 mm
calibrate LVDT by taking __ data points
5
as long as yield stress is not exceeded anywhere in the LVDT beam, the beam will obey Hooke's Law
we can expect linear relation of form F=k& between load F applied at end of beam and tip deflection &
Hooke's Law: F=k& what is k
stiffness (spring constant of Hooke's Law)
stiffness ratio for 2 aluminum beams of different radii
(k1/k2)=(r1^3/r2^3)
stiffness for steel and aluminum beams of equal diameter
(ks/kal)=(Es/Eal)
(E is Young's modulus)
Esteel
200 GPa
Ealuminum
70 GPa
used as force transducers and commonly referred to as "load cells"
elastic members
output of an elastic member (load cell) transducer
electrical voltage that is proportional to the force that is transmitted through the elastic element
as long as yield stress is not exceeded in elastic member (and we are operating at sufficiently low temperature so creep is not relevant),
behavior of member in response to applied force or displacement will be completely linear
response of elastic member is measured by measuring the ____ at a point on the member
strain
using elastic member, strain at a point is ______ of either applied displacement or applied load
linear function
device commonly used to make strain measurements
strain gage
limitations of strain gage
environmental conditions (high temp, corrosive environment, etc)
how are strain gages applied
normally bonded (glued or welded) to location at which we wish to measure strain
strain gages function by
changing their electrical characteristics (resistance, capacitance) as a (hopefully linear) function of the applied strain; we measure the change to get measure of applied strain form of electrical signal
most strain gages experience change in _____ as they are strained
resistance
strain gage factor F formula
E = (1/F)(change in R / R)
where R is gage resistance
the larger the value of F, the larger the value of ______ for given strain level E
change in R (gage resistance)
are larger or smaller values of F preferred for strain gage?
larger because larger values of (change in R) can be measured with greater precision
most common type of resistance-type strain gage
foil gage
how does foil gage work
thin strip of foil laid in rows along axis of gage; as foil is stretched along axis its resistance changes linearly with strain
examples of resistance-type strain gages
foil gage, semiconductor gage
how does semiconductor gage work
same as foil but uses strip of silicon; has gage factor of F=100, so good for applications where accuracy is important (like load cells)
pros of foil gage
inexpensive, easy application, flexible so can be applied to curved surfaces
cons of semiconductor gage
higher cost, brittle so difficult to apply to curved surface
counteract thermal strains due to changes in temperature (which would add to measured strain value)
strain gages attached to loaded members too often used w dummy gages attached to unloaded material (both loaded and unloaded members experience same thermal strain, so can subtract)
simple force transducer explanation
elastic ring w/ 4 strain gages wired as the 4 resistors of a Wheatstone Bridge & connected to signal conditioning device; when ring is extended, outside gages are in tension* and inside in compression; as long as yield stress not exceeded, force required to elongate ring will be linear function of measured strain values;
simple force transducer input and output
input: 6 volt d.c. battery
output: fed into A/D board inside a computer (voltage proportional to the strain at the gour gages and the input voltage)
using simple force transducer
calibration: under static conditions, keep adding weights for 5 weight/voltage points, then record slope k of linear fit
experiment: series of measurements of friction force required to pull a weight across a flat surface
how universal testing machine works
applies load through motion of a crosshead driven by two screwjacks; as screwjacks rotate, crosshead moves up and down
behavior of movement friction experiment
"slip and stick" - cable slackens as weight moves forward, reducing applied force and causing weight to come to temporary halt because force is no longer great enough to overcome friction force
a material element in a state of pure shear (such as exists in a torsion test) undergoes no...
change in volume
easier to interpret results of a stress-strain plot obtained in ______ than it is for more common tensile test
torsion
to obtain stress-strain behavior we need situation where the stress is ____ as is the case in a uniaxial stress test
statically determinate
if tube is sufficiently thin (relative to mean radius), we can assume the the shear stress is...
approximately constant across the thickness