Chapter 8: Measuring and Controlling Quality pt2
Measuring and Controlling Quality
Process Capability Indexes
- Definitions:
- The process capability index measures the relationship between specifications and natural variation.
- Formula:
- ( C_p = \frac{USL - LSL}{6 \sigma} )
- Where USL = Upper Specification Limit, LSL = Lower Specification Limit, and ( \sigma ) = standard deviation.
- Interpretation of C_p:
- ( C_p > 1 ): Process can meet specifications (process variation < specification range).
- ( C_p < 1 ): Process is incapable of producing conforming output.
One-Sided Indexes
- Used for process centering:
- Upper one-sided index: ( C_{pu} = \frac{USL - \mu}{3 \sigma} )
- Lower one-sided index: ( C_{pl} = \frac{\mu - LSL}{3 \sigma} )
- Combined: ( C{pk} = \min(C{pl}, C{pu}) = Cp(1 - k) )
- Where ( k = \frac{2 \times |\mu - T|}{USL - LSL} )
- Confidence Interval for C_pk:
- ( C{pk} \pm z{\alpha/2}\sqrt{\frac{1}{9n} + \frac{C_{pk}^2}{2(n-2)}} )
- Initial Specification:
- Dimensions: 0.575 ± 0.007 inch
- Statistics from First Sample:
- Mean ( \bar{x} = 0.5740 ), Standard deviation ( \sigma = 0.0067 )
- Calculating Capability:
- ( C_p = \frac{0.582 - 0.568}{6 \times 0.0067} = 0.3483 ) (Not capable)
- Upper index: ( C_{pu} = \frac{0.582 - 0.574}{3 \times 0.0067} = 0.398 ) (Not capable)
- Lower index: ( C_{pl} = \frac{0.574 - 0.568}{3 \times 0.0067} = 0.299 ) (Not capable)
- Combined: ( C_{pk} = 0.299 ) (Not capable)
- Post-Adjustment Statistics:
- Mean ( \bar{x} = 0.5755 ), Standard deviation ( \sigma = 0.0017 )
- New Capability Calculations:
- ( C_p = \frac{0.582 - 0.568}{6 \times 0.0017} = 1.373 ) (Capable)
- Upper index: ( C_{pu} = \frac{0.582 - 0.5755}{3 \times 0.0017} = 1.28 ) (Capable)
- Lower index: ( C_{pl} = \frac{0.5755 - 0.568}{3 \times 0.0017} = 1.47 ) (Capable)
- Combined: ( C_{pk} = 1.28 ) (Capable)
Statistical Process Control (SPC)
- Definition:
- Methodology for monitoring processes to identify variations and implement corrective actions.
- Control Charts:
- Visual tools with horizontal lines (UCL, LCL) indicating control limits.
Process Control States
- Process is in control: Only common causes of variation present.
- Process is out of control: Special causes present.
Developing Control Charts
- Steps:
- Collect data when the process is in control.
- Determine control limits.
- Analyze the chart.
- Use for ongoing control.
- Improvements often follow the introduction of control charts.
Control Chart Construction
- Selection depends on sample size, characteristics of the data, and intended monitoring (e.g., variable vs. attribute).
- Types of charts include X-bar, R-chart, p-chart, c-chart.
Example: River Bottom Fire Department
- Purpose: Evaluate response times using control charts.
- Data Collection: 30 samples, calculate means, ranges, control limits.
- Results:
- Control limits for x-chart:
- UCL: ( 4.731 ), LCL: ( 4.357 )
- Control limits for R-chart:
- UCLR: 0.776, LCLR: 0
p-Charts
- Definition: Monitor the fraction of nonconforming units.
- Calculations:
- Daily samples of nonconformances, estimate the standard deviation.
- Control limits: UCL, LCL based on proportion ( p ) and standard deviation.
Example: Altodiez Package Co.
- Data: 200 orders inspected daily, errors counted for 25 days.
- Center line and control limits:
- Center line: ( p = 0.0256 )
- UCL: 0.0591, LCL: 0 (correcting for negative values).
Patterns in Control Charts
- Key Indicators of Control:
- No points outside control limits.
- Random distribution of points around the center line.
- Most points near the center line, few near limits.
- Unusual Patterns:
- Out-of-control points, shifts, cycles, trends.
Sampling Considerations
- Homogeneity in Samples:
- Rational subgroups minimize within-sample variability.
- Sample Size Implications:
- Small samples reduce cost but are less informative. Larger samples better for detecting smaller shifts.
Control Limits and Sampling Frequency
- Adjustment of Control Limits:
- Effects cost of false conclusions.
- Frequency of Sampling:
- Balance between cost and timely detection of changes.
Cost Considerations for Control Limits and Sample Size
- High investigation costs favor wider limits.
- Significant defect costs favor narrower limits.
- When both costs are high, wider limits and larger sample sizes recommended.
Conclusion
- Understanding process capabilities and control is crucial for quality management.
- Properly constructed control charts and careful consideration of sampling size and frequency improve quality monitoring.