Macromolecular X-Ray Crystallography Study Notes
Macromolecular X-Ray Crystallography
Dr. Jose Ortega-Roldan
Phase Problem
The phase problem is a significant issue in macromolecular X-ray crystallography, primarily due to the difficulty in obtaining phase information compared to intensity data.
Information Contained in Intensities and Phases
Phases:
Difficult to obtain but provide vital information necessary for structure determination.
Intensities:
Easier to obtain.
Data Collection:
Collect intensities through X-ray diffraction, which involves Fourier transforms of the data.
Wave Information
Amplitude:
Represented as amplitude (A) and amplitude squared (A^2).
Proportional relationship: Intensity of reflection is proportional to amplitude.
Wavelength:
Key in determining diffraction properties of the waves.
Phase Differences:
Waves can differ in phase by various angles, such as 90°.
Solving the Phase Problem
1. Isomorphous Replacement (Isomorphous Substitution)
Methodology:
The phases of protein reflections can be determined by adding one (or a few) heavy atoms (e.g., Mercury (Hg), Platinum (Pt), Gold (Au)) to each unit cell without altering crystal packing or protein conformation.
Process:
Use the interference behavior caused by heavy atoms to identify their positions directly from intensity differences in diffraction patterns.
Only feasible with one or two heavy atoms per asymmetric unit.
Example:
Two diffraction patterns can be observed: one from native bovine $eta$-lactoglobulin and another from the crystal soaked in a mercury-salt solution.
2. Multiwavelength Anomalous Dispersion (MAD) or Single-wavelength Anomalous Dispersion (SAD)
Overview:
Certain heavy atoms (e.g., Iron (Fe), Selenium (Se), Mercury (Hg), Platinum (Pt), Iodine (I)) absorb radiation at specific resonance frequencies, leading to differences in diffraction intensities.
Incorporation of Selenomethionine:
Often included during recombinant expression, which aids in phasing.
Data Collection:
Three datasets are measured at different wavelengths, requiring a synchrotron radiation source.
Use intensity differences to calculate positions of anomalous atoms in the unit cell, helping derive phases similar to isomorphous replacement.
The small size of intensity differences demands high-energy synchrotron radiation for sensitivity.
3. Molecular Replacement
Requirements:
Requires the known structure of a similar protein (phasing model) with the same fold.
Procedure:
Superimpose known structure in the unit cell based on diffraction pattern characteristics.
Calculate diffraction pattern for the known model and use the phases as phase estimates for the unknown structure.
Applications:
Particularly effective for homologous proteins, site-directed mutants, and small ligand complexes.
Structural Similarity:
If protein sequence identity is greater than 30%, it indicates a high probability of exhibiting the same fold.
Refinement
Phase Refinement
Objective:
Calculate electron density maps using phases from the new model combined with native intensities.
Building Models:
Models are built based on discernible elements, considering known peptide geometries (bond lengths, bond angles).
Assessment of Agreement:
Degree of agreement between model and native dataset is expressed by the R-factor (residual index).
Importance of Structure Factor
Definition:
Structure factor $F(hkl)$ represents both amplitude and phase of any X-ray reflection hkl.
Quality Assessment:
Comparison between previous and new models’ structure factors is essential to assess refinement quality.
Difference Electron Density Maps
Formulation:
$p(xyz) = rac{1}{V} imes ext{Σ} (F{ ext{obs}} - F{ ext{calc}}) imes ext{exp}[-2 ext{i} (h x + k y + l z)]$.
Significance:
These maps reveal where model discrepancies occur, highlighting maxima for missing atoms and minima for wrongly positioned atoms (negative electron density).
Resolution in Crystallography
Concept of Resolution
Definition:
Resolution refers to the distance between peaks in electron density maps which can be interpreted as separate atoms.
Mathematical Expressions:
Maximum achievable resolution is determined by the diffraction equation: $n imes ext{λ} = 2d imes ext{sin}( heta_{ ext{max}})$.
Diffraction Limits:
Common diffraction limits reached in practice include from 5.5 Å down to 0.8 Å.