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What can we find using electron diffraction
whether the specimen is crystalline or amorphous
whether the specimen is single-crystal or polycrystalline
identity of the crystal structure
orientation of specimen w.r.t beam
character defects
Angular distribution of electron scattering
Can be viewed as electron diffraction pattern
spatial distribution of electron scattering
can be observed as contrast in images of specimen
Center spot in diffraction pattern
correctors to a direct beam (forward scattered electrons)
Any spot deviated from central spot in diffraction pattern
Corresponds to a specific crystalline plane where many electrons are scattered within a crystalline specimen
elastic scattering
scattering without losing energy
Inelastic scattering
scattering with the loss of some energy at a relatively low angle
Electron-electron interaction
scattering through interaction with the electron cloud…due to Coulombic interaction and results in low scattering angles (mostly inelatic)
Electron-nucleus interaction
scattering by the nucleus…due to Coulumbic attraction and results in higher scattering angles
Atomic scattering factor
The amplitude of radiation scattered by a single atom. It varies with atomic number and with the angle of scattering.
What affects electron scattering factor
Heavier atoms scatter more strongly than lighter atoms at any particular angle
At higher accelerating voltage electrons are scattered less
Lower angle results in a higher scattering factor
Constructive interference
Waves reinforce one another when they are in phase..corresponds to bright spots in electron diffraction
Destructive interference
Waves cancel one another when they are out of phase
Camera constant concept
rd = Lλ
r: distance between direct beam and diffracted beam
d: interplanar spacing
L: camera length
λ: electron wavelength determined by accelerating voltage
Crystalline materials
atoms are situated in a periodic array over large distances
Glassy (amorphous) material
where long range order is absent
Structure factor of amorphous materials
Atoms are arranged almost randomly, but the first- and second-nearest neighbor spacings are well defined…will se a few characteristic peaks and then rest will wash out
Structure factor of crystalline materials
Atom positions are fixed…intensity of diffracted beams show maxima at specific angles where electrons are more strongly scattered
Electron diffraction pattern of amorphous materials
Diffuse rings
Electron diffraction pattern of single crystal materials
sharp spots of diffracted beam
Electron diffraction pattern of single crystal w/ multiple grains
sharp spots but with more since grains are in different orientations and those spots are superimposed on each other
Structure factor
a sum of the atomic scattering factors f(θ) from all the atom positions in the unit cell…describes the amplitude of electron wave scattered by a unit cell of crystal structure
Intensity and Structure Factor
The intensity of a particular reflection (hkl) is proportional to the structure factor squared
Allowed reflections for a simple BCC lattice
Fhkl =f [1 + cosπ(h+k+l)]
if h+k+l = odd integer, Fhkl = 0 (you won't see a diffraction spot)
if h+k+l = even integer, Fhkl = 2f (you'll see a diffraction spot)
Allowed reflections for a simple FCC lattice
Fhkl =f [1 + cosπ(h+k) + cosπ(k+l) + cosπ(h+l)]
if h, k, l = all odd/all even, Fhkl = 4f (you'll see a diffraction spot)
if h, k, l = mixed odd & even, Fhkl = 0 (you won't see a diffraction spot)
Formation of spot patterns
diffraction occurs from planes which are approximately parallel to the electron beam
Ewald sphere
The relationship between the reciprocal lattice and diffraction pattern
Ewald sphere construction
diffracting crystal represented by reciprocal lattice
electron beam represented by a vector of length 1/λ parallel to beam direction, terminating at origin of reciprocal lattice
sphere of radius 1/λ drawn
diffraction occurs when Ewald sphere touches a reciprocal lattice point
Visibility of spots in diffraction pattern
Thinner specimen stretches the reciprocal lattice into long rods which allows the Ewald sphere to touch more of the points on the reciprocal lattice…more/sharper spots
Thicker specimen collapses reciprocal lattice into tiny spots…more diffuse spots/few of them
Deviation parameter, s
A measure of how far the diffraction event deviates from the exact Bragg condition
Convergent beam electron diffraction
Focus the beam to a point to get a diffraction pattern consisting of large spheres
CBED non-titled incident ray
gives rise to an intensity at the exact center of the disk
CBED tilted incident ray
gives rise to off-centered intensities on the disk
CBED mode condenser aperture
the size of the disks in the diffraction pattern are controlled by the condenser aperture which controls the convergence angle of the probe
CBED mode aperture sizes
small - kossel-mollenstedt pattern
large - kossel pattern
medium - ideal situation that maximizes information scene in pattern and ensures the disks aren't overlapping
CBED features
discs instead of spots
strong kikuchi lines
extra details within the disc
HOLZ rings
Local strain measurement
Positions of HOLZ deficiency lines in the 000 disk highly depend on the state of strain in the crystal
HOLZ stands for
higher order Laue zone
Thickness dependence of CBED pattern
thinnest samples = not much detail is seen in disk
as sample gets thicker = more detail of the dynamical fringes can be seen in the center
*symmetry of pattern does not change ats crystal thickness increases
Kikuchi lines
complex patterns of pairs of bright and dark lines are superimposed on the single crystal diffraction pattern (bright = excess line, dark = deficiency line)
As crystal is tilted
i) the kikuchi lines sweep across the diffraction pattern
ii) the diffraction spots stay fixed but their intensity changes
Formation of kikuchi lines
assuming electrons are incoherently scatter then more electrons are scatter in one direction vs. another which leads to an excess (bright) and deficiency (dark)
Kikuchi maps for navigation
Narrow bands = take you to a more "distinct" zone axis
Wide bands = take you to a less common zone axis`
Why are kikuchi lines sharper in CBED
A convergent beam impinges on a much smaller region of the specimen than a region selected by a SAD aperture.Since the small region contains much less lattice distortion due to strain or defects, the Kikuchi lines in CBED are generally sharper.