Surface Characterization

contact angles description

liquid wetting of surfaces is used to estimate the energy of surfaces

ESCA (XPS) description

X-rays induce the emission of electrons of characteristic energy

Auger electron spectroscopy description

A focused electron beam stimulates the emission of Auger electrons

SIMS description

ion bombardment sputters secondary ions from the surface 

ATR FTIR description

IR radiation is adsorbed and excites molecular vibrations

STM description

measurement of the quantum tunneling current between a metal tip and conductive surface

SEM description

Secondary electron emission ­induced by a focused electron beam is spatially imaged

Depth analyzed contact angles

3-20 A

Depth analyzed ESPA (XPS)

10-250 A

depth analyzed auger electron spectroscopy

50-100 A

Depth analyzed SIMS

10a-1micrometer

ATR FTIR depth analyzed

1-5micrometers

STM depth analyzed 

5A

SEM depth analyzed

5A

Spatial resolution contact angles

1mm

SR ESCA(XPS)

10-150micrometers

SR auger electron spectroscopy

100A

SR SIMS

100A

SR ATRFTIR

10mircometers

SR STM

1 A

SR SEM

40 A